Overview

The Application Training Program on X-ray Diffractometers (XRD) is designed to provide participants with fundamental knowledge and practical exposure to XRD characterization techniques. The program covers the basic principles of X-ray diffraction, instrument components, sample preparation methods, data acquisition, phase identification, and interpretation of diffraction patterns. Participants will gain hands-on understanding of how XRD is used for material characterization, crystal structure analysis, and qualitative and quantitative phase analysis in research and industrial applications. This training aims to enhance the technical skills of students, researchers, and faculty members in utilizing XRD effectively for scientific investigations.

Learn_the_Basics_of_XRD_Characterization_Techniques_Poster.pdf

Objectives of Event

• To understand the fundamental principles of X-ray Diffraction (XRD), including Bragg’s Law and crystal structure analysis.

• To familiarize participants with the configuration and operation of the XRD instrument, including its major components and safety procedures.

• To develop skills in sample preparation and data acquisition for accurate diffraction measurements.

• To perform phase identification and basic quantitative phase analysis using standard databases and software.

• To interpret XRD patterns and apply the technique in research, industrial, and material characterization applications.

Convener Details

• Dr. Atul Kumar Gupta (Head, CIF);
• Dr. Mohit Sahni, Associate Dean RDC,
• Dr. Anupam Agarwal, Head Department of Chemistry and Biochemistry                                     

Co-ordinators:

• Dr. Afsar Ali 

Speaker Details:

• Dr. Sandeep Nagar, Application Specialist, Malvern Panalytical