Overview

X-ray Diffraction (XRD) is a non-destructive analytical technique used to identify crystalline materials and determine their structural properties. When monochromatic X-rays strike a crystalline sample, they are diffracted by atomic planes according to Bragg’s Law (nλ = 2d sinθ). The resulting diffraction pattern acts as a “fingerprint” of the material.


Learn_the_Basics_of_XRD_Characterization_Techniques_Poster.pdf

Objectives of Event

  • Understand principles of XRD and Bragg’s Law

  • Learn instrument operation and configuration

  • Perform phase identification and analysis

  • Interpret diffraction data

 

  • Apply XRD in research and industrial problems

Convener Details

  • Dr. Atul Kumar Gupta (Head, CIF);
  • Dr. Mohit Sahni, Associate Dean RDC,
  • Dr. Anupam Agarwal, Head Department of Chemistry and Biochemistry                                     

Co-ordinators:

Dr. Afsar Ali

Speaker Details:

  • Dr. Sandeep Nagar, Application Specialist, Malvern Panalytical